Work with frontend team DFT and crossfunctional teams to provide the solutions and make sure DFT DRCs are fixed
Generating highquality manufacturing ATPG test patterns for (SAF) stuckat transition fault (TDF) Path Delay fault (PDF) models and through the use of onchip test compression techniques.
Requirements
BE/ BTech/ MTech/MS/ PhD in Electronics Electrical Computer Engineering or Computer Science Engineering with 4 10 years of exp.
Highly motivated and driven to face challenging design and debug problems
Indepth knowledge and handson experience in scan insertion ATPG coverage analysis and Transition delay test coverage analysis.
Analyze the design and propose the best compression technique.
Indepth knowledge and handson experience in Scan insertion and validation BIST LBIST MBIST insertion and verification ATPG IP tests and Pattern Validation w/wo Timing DFT mode timing analysis and signoff.
Handson experience in various DFT aspects like Scan insertion MBIST and Boundary Scan ATPG Pattern validation at block level as well as Fullchip level
Tessent DFT expertise methodology and flow development
Working experience in Synopsis TetraMax/DFTMax and Cadence Encounter Test is desired.
Scripting Languages Shell scripting Python TCL PERL etc.
Be able to work and support Test Engineers for postsilicon tasks.
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